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Advanced Mathematical and Computational Tools in Metrology and Testing IX (Series on Advances in Mathematics for Applied Sciences)

Pavese, Franco (EDT)/ Baer, Markus (EDT)/ Filtz, Jean-remy (EDT)
975.24 MYR
Member Price
877.72
English

Product Description

This volume contains original, refereed worldwide contributions. They were prompted by presentations made at the ninth AMCTM Conference held in Göteborg (Sweden) in June 2011 on the theme of advanced mathematical and computational tools in metrology and also, in the title of this book series, in testing.The themes in this volume reflect the importance of the mathematical, statistical and numerical tools and techniques in metrology and testing and, also in keeping the challenge promoted by the Metre Convention, to access a mutual recognition for the measurement standards.Sample Chapter(s)
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This volume contains original, refereed worldwide contributions. They were prompted by presentations made at the ninth AMCTM Conference held in Göteborg (Sweden) in June 2011 on the theme of advanced mathematical and computational tools in metrology and also, in the title of this book series, in testing.The themes in this volume reflect the importance of the mathematical, statistical and numerical tools and techniques in metrology and testing and, also in keeping the challenge promoted by the Metre Convention, to access a mutual recognition for the measurement standards.

... Read Full Text

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