{"product_id":"9789812389404","title":"Radiation Effects and Soft Errors in Integrated Circuits and Electronic Devices (Selected Topics in Electronics and Systems)","description":"\u003cp\u003eThis book provides a detailed treatment of radiation effects in electronic devices, including effects at the material, device, and circuit levels. The emphasis is on transient effects caused by single ionizing particles (single-event effects and soft errors) and effects produced by the cumulative energy deposited by the radiation (total ionizing dose effects). Bipolar (Si and SiGe), metal-oxide-semiconductor (MOS), and compound semiconductor technologies are discussed. In addition to considering the specific issues associated with high-performance devices and technologies, the book includes the background material necessary for understanding radiation effects at a more general level.\u003c\/p\u003e","brand":"World Scientific Publishing Co Pte Ltd","offers":[{"title":"Default Title","offer_id":52527490171191,"sku":"00000_00000_00000_00000","price":877.71,"currency_code":"MYR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0962\/3548\/7543\/files\/9789812389404-1.jpg?v=1783299460","url":"https:\/\/kinokuniya.com.my\/products\/9789812389404","provider":"Books Kinokuniya Malaysia","version":"1.0","type":"link"}