{"product_id":"9780792386865","title":"Analog and Mixed-Signal Boundary-Scan : A Guide to the IEEE 1149.4 Test Standard (Frontiers in Electronic Testing)","description":"\u003cp\u003eTesting of a system does not follow directly from the testing of its parts, and a system built with testable parts can sometimes be impossible to test. Even if all digital chips are compliant with the standard, the testability of a mixed-signal system cannot be guaranteed.\u003c\/p\u003e","brand":"Kluwer Academic Pub","offers":[{"title":"Default Title","offer_id":52269306839351,"sku":"00000_00000_00000_00000","price":921.0,"currency_code":"MYR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0962\/3548\/7543\/files\/9780792386865-1.jpg?v=1783125710","url":"https:\/\/kinokuniya.com.my\/products\/9780792386865","provider":"Books Kinokuniya Malaysia","version":"1.0","type":"link"}