{"product_id":"9780471731726","title":"Reliability Wearout Mechanisms in Advanced CMOS Technologies (Ieee Press Series on Microelectronic Systems)","description":"\u003cp\u003eThis invaluable resource tells the complete story of failure mechanisms from basic concepts to the tools necessary to conduct reliability tests and analyze the results. Both a text and a reference work for this important area of semiconductor technology, it assumes no reliability education or experience.\u003c\/p\u003e","brand":"IEEE","offers":[{"title":"Default Title","offer_id":52276478968119,"sku":"00000_00000_00000_00000","price":1148.34,"currency_code":"MYR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0962\/3548\/7543\/files\/9780471731726-1.jpg?v=1783112177","url":"https:\/\/kinokuniya.com.my\/products\/9780471731726","provider":"Books Kinokuniya Malaysia","version":"1.0","type":"link"}