{"product_id":"9781498779470","title":"Optical Inspection of Microsystems, Second Edition (2ND)","description":"\u003cp\u003eThis book provides an up-to-date survey of the most important and widely used full-field optical metrology and inspection technologies. Techniques such as interference microscopy, laser Doppler vibrometry, holography, speckle metrology, spectroscopy and deflectrometry and digital holographic microscropy for the inspection of MEMS.\u003c\/p\u003e","brand":"CRC Press Inc","offers":[{"title":"Default Title","offer_id":52395379392823,"sku":"00000_00000_00000_00000","price":1896.3,"currency_code":"MYR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0962\/3548\/7543\/files\/9781498779470-1.jpg?v=1783212280","url":"https:\/\/kinokuniya.com.my\/ja\/products\/9781498779470","provider":"Books Kinokuniya Malaysia","version":"1.0","type":"link"}